Abstract:
Advancements in instrumentation and metrology over the past decade have been extraordinary, blurring the boundaries between measurement domains. We rely on these tools as windows into reality, yet the increasing complexity of measurement setups, abstraction of instrument functions, and limited user experience (often) result in erroneous characterizations. Faulty measurements not only risk reputational damage within the scientific community but can also lead to costly failures, potentially causing millions of dollars in losses during productization. This lecture celebrates the ingenuity of modern test equipment while also highlighting their limitations and the challenges of accurate DUT characterization.

Biography:
Shahriar Shahramian (SM ’06) received his Ph.D. degree from University of Toronto in 2010 where he focused on the design of mm-wave data converters and transceivers. Shahriar has been with the Bell Laboratories – Nokia since 2009 and is currently the Lab Leader (Director) of the RFIC & Packaging Research Lab. His research focus includes the design of mm-wave wireless and wireline integrated circuits and systems. Shahriar is a Bell Labs Fellow and leads the design and architecture of several state-of-the-art ASICs for optical coherent and wireless backhaul products. Shahriar has served as the chair mm-Wave & THz subcommittee of IEEE BCICTS & mm-Wave SoCs at IEEE RFIC and member of the technical program committee IEEE ISSCC. He has also served as the guest Editor of the IEEE Journal of Solid-State Circuits (JSSC).

Shahriar has been the recipient of Ontario Graduate Scholarship & University of Toronto Fellowship, and the best paper award at the CSICS & Symposium in 2005, 2015 and RFIC Symposium in 2015, 2020, 2022 and ISSCC& in 2018. Shahriar is also the recipient of the IEEE MTT Young Engineer Award in 2020. He holds an Adjunct Associate Professor position at Columbia University, has received several teaching awards and is the founder and host of The Signal Path educational video series. Shahriar has also presented short courses and workshops at the IEEE CSICS, BCTM, BCICTS, RFIC/IMS and ISSCC conferences.