Dielectric Measurements of Conventional and 3-D Printed Substrate Materials from 50GHz to 1.5THz Using Free-Space and TDS Methods

This paper presents a study characterizing three conventional substrate dielectric materials, along with one new 3-D printed dielectric (RADIX), all supplied by Rogers, over the frequency range of 50 GHz to 1.5 THz. Two measurement methods were employed: guided free-space approach using material characterization kits (MCKs) and time-domain spectroscopy (TDS). The 3-D printed dielectric was measured using TDS systems located at two different laboratories, enabling an interlaboratory comparison to validate the results. The measurement results show good agreement between both methods and across the two laboratories. This work provides useful insights for use of these conventional and novel substrate materials in millimeter-wave and THz applications.