Cryogenic On-Wafer Noise Measurements Using a Cold-Attenuator Method

This presentation discusses cryogenic characterization techniques for the development of cryogenically cooled MMIC LNAs. On-chip testing at cryogenic temperatures speeds up chip developments and qualifications. A focus lies on cryogenic measurements on chip level in order to gather data for device model extraction and for cryogenic MMIC design. Moreover, the talk will discuss on-chip noise characterization including an uncertainty analysis for MMIC testing and model extraction. An overview of recent cryogenic model results and LNA MMIC designs, including state-of-the-art results in different frequency bands, concludes the talk.